ZEISS Visioner 1

Digital microscope featuring MALS™ technology, real-time all-in-focus optical inspection

Classic inspections systems offer shallow depth of field, this means that parts of the sample may not be in focus, which can lead to missing features, user fatigue, and incomplete inspection.

ZEISS Visioner 1 revolutionizes the world of optical inspection and documentation. Driven by the unique Micro-mirror Array Lens System (MALSTM technology), enables for the first time, real-time all-in-focus imaging – first time, every time.

Real-time Extended Depth of Field (EDoF)

EDoF is a process where multiple images through the focal plane are combined to create one in focus image.

With classic microscopy systems, this can be time consuming and complex.
ZEISS Visioner 1 enables the user to see the sample completely in focus in real-time, without the need to Z-Stack and post process a series of images.

The unique Micro-mirror Array Lens System (MALS™) technology allows for real-time Extended Depth of Field (EDoF).

Reshaping the rules of optics

Micro-mirror Array Lens System (MALS™) technology

MALS™ allows optical inspection for height differences of up to 69 mm* to be in focus. Without the need for Z-stacking or re-focusing.

Using a micro-mirror array lens system (MALS™) enables us to generate “virtual” lenses with distinctly different curvatures, thus different focus planes. This is achieved by changing the orientation of each individual micro-mirror in an orchestrated way.

Re-shaping the curvature of this “virtual” lens at speed enables ultra-fast focusing and real-time all-in focus imaging and documentation.

ZEISS Visioner 1 driven by MALS™ technology

  • Up to 100x more usable Extended Depth of Field
  • Allows for height differences of up to 69mm*
  • Reflective micro-mirror array with curvatures (variable) arranged in a flat plane
  • Each micro-mirror is about 100x100 µm
  • Each micro-mirror rotates & translates to form the optical surfaces with variable curvatures
  • No need for Z-stacking or re-focusing

Fastest 3D visualization with documentation

ZEISS Visioner 1 not only simplifies the imaging and documentation task, but the real-time EDoF enables you to inspect your component faster, delivering higher throughput.

An extension of your senses

Ergonomic operation

Remove the fatigue of the eyepieces and work more efficiently by using your hands for your inspection task instead of continuously re-adjust the microscope.

As everything is displayed in real-time, all-in-focus on a single screen, the inspection task feels most natural, like an extension of your senses. 

Classic microscope posture
Classic microscope posture
ZEISS Visioner 1 ergonomic posture
ZEISS Visioner 1 ergonomic posture

Applications

Elec-traditional-scale
Inspected by classic microscope
Elec-visioner-scale
Inspected by ZEISS Visioner 1
Bulb-traditional-scale2
Inspected by classic microscope
Bulb-visioner-scale2
Inspected by ZEISS Visioner 1
Image-FreeModeAcquisition-05
Inspected by classic microscope
Image-FreeModeAcquisition-06--01
Inspected by ZEISS Visioner 1

Image comparison of a needle, an electric board and a resistance using a Classic Inspection Method vs. ZEISS Visioner 1. Due to the new MALS™ technology the part can be viewed all-in-focus, first time, every time.

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Solutions brochure Semiconductor EN PDF

Solutions brochure Semiconductor EN PDF
页: 24
文件大小: 14136 kB

ZEISS Application Note Visioner 1 Blade Inspection Flyer

ZEISS Application Note Visioner 1 Blade Inspection Flyer
页: 3
文件大小: 2230 kB

ZEISS Visioner1 Accessories DE

ZEISS Visioner1 Accessories DE
页: 3
文件大小: 1996 kB

ZEISS Visioner1 Accessories EN

ZEISS Visioner1 Accessories EN
页: 3
文件大小: 1998 kB

ZEISS Visioner 1 Brochure EN

ZEISS Visioner 1 Brochure EN
页: 7
文件大小: 5851 kB

ZEISS Visioner 1 Poster, EN

ZEISS Visioner 1 Poster, EN
页: 1
文件大小: 1097 kB